SCHEDULES

F1SCHEDULE 2EQuantum computing and advanced materials goods and technology PART 1

Annotations:
Amendments (Textual)

PART 2

Quantum computing and advanced materials goods8

Microscopes, related equipment and detectors, as follows—

a

scanning electron microscopes (SEM);

b

scanning auger microscopes;

c

transmission electron microscopes (TEM);

d

atomic force microscopes (AFM);

e

scanning force microscopes (SFM);

f

equipment and detectors specially designed for use with the microscopes specified in sub-paragraphs (a) to (e), employing any of the following—

i

X-ray photo spectroscopy (XPS);

ii

energy-dispersive X-ray spectroscopy (EDX, EDS);

iii

electron back scatter detector (EBSD) systems;

iv

electron spectroscopy for chemical analysis (ESCA).