SCHEDULES

[F1SCHEDULE 2EU.K.Quantum computing and advanced materials goods and technology PART 1

PART 2U.K.

Quantum computing and advanced materials goodsU.K.

8.  Microscopes, related equipment and detectors, as follows—

(a)scanning electron microscopes (SEM);

(b)scanning auger microscopes;

(c)transmission electron microscopes (TEM);

(d)atomic force microscopes (AFM);

(e)scanning force microscopes (SFM);

(f)equipment and detectors specially designed for use with the microscopes specified in sub-paragraphs (a) to (e), employing any of the following—

(i)X-ray photo spectroscopy (XPS);

(ii)energy-dispersive X-ray spectroscopy (EDX, EDS);

(iii)electron back scatter detector (EBSD) systems;

(iv)electron spectroscopy for chemical analysis (ESCA).]